The laboratory in 353 Cory supports a junior-level, core microelectronics course using the new text Microelectronics: An Integrated Approach, by R. T. Howe and C. G. Sodini (Prentice Hall, 1997). Devices are characterized fully using HP 4155 A/B Parameter Analyzers and circuits based on integrated embodiments of these devices on chips are characterized for performance. To facilitate this comparison of devices and circuits a special set of 6 chips has been designed at UC Berkeley in collaboration with Micro Linear in a 1.5 micron BiCMOS tile array technology. The Lab Chips include "bare," accessible versions of the core IC analog and digital circuit building blocks that are introduced in the lectures. Therefore, the lab experiments serve to reinforce the lectures and vice versa.

A total of 11 weekly laboratories will be used this semester including an introductory laboratory on the use of the device characterization equipment.

A reader including the Laboratory Manual and solutions to even exercises in the textbook is now available from:

Copy Central (Southside)
2560 Bancroft Way
(510) 848-8649

Experiment 1 - The Curve Tracer

Experiment 2 - Introduction to Electronic Test Equipment

Experiment 3 - IC Resistors

Experiment 4 - Introduction to PSPICE

Experiment 5 - MOS Device Characterization

Experiment 6 - Bipolar Junction Transistor Characteristics

Experiment 7 - Single Stage Amplifiers with Passive Loads - MOS

Experiment 8 - Single Stage Amplifiers with Passive Loads - BJT

Experiment 9 - Frequency Response

Experiment 10 - Multistage Amplifiers

Experiment 11 - Current and Voltage Sources

Acknowledgments
Many people from Berkeley have made significant contributions to the development of the Lab Chips in collaboration with Micro Linear. These chips and the laboratory manual have been made available in the public domain. See the laboratory manual and the course resource web pages for more detail.