EE130/230A Discussion Notes | ||||||
Fall 2013 |
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(Powerpoint format) |
Week 1: Si crystal structure and crystallographic notation; intrinsic carrier concentration Week 2: Electron and hole concentrations, relationship with Fermi level; energy band diagram Week 3: Conductivity; carrier mobility; carrier recombination-generation; non-uniformly doped semiconductor Week 4: Illumination with light; M-S contacts; Schottky contact to p-type Si example Week 5: Schottky diode current flow; practical ohmic contact; pn junction electrostatics Week 6: Long-base diode; short-base diode; diode I-V characteristics Week 7: Charge-control model; small-signal model; turn-off transient response. Week 8: MOS capacitor energy band diagrams for n-type Si. Week 9: PMOS capacitor electrostatics, threshold voltage, C-V characteristics. Week 10: MOS capacitor non-idealities; MOSFET operation. Week 11: Sample MOSFET I-V problem; MOSFET small-signal model, subthreshold current, drain-induced barrier lowering. Week 12: Impact of velocity saturation on MOSFET I-V; short-channel effect. Week 13: Thin-body MOSFET structures; BJT fundamentals. Week 14: BJT I-V, Ebers-Moll model. Week 15: BJT Early voltage, punchthrough, Gummel plot, charge-control model, small-signal model. |